Inline AOI system Model 7505-02
- For ITO (Indium Tin Oxide)Thin-film, RFID and FPC Roll to Roll process online real-time automatic optical inspection
- Equipped with high resolution line scan camera, has capabilities of detecting defects, like bubbles, scratches and so on.
- Use multi-line camera to acquire
Multi-Functional Optical Measuring System Model 7505-05
- Applies to Mobile phone cosmetic, battery, CG quality testing
- Integrated with 2D & 3D measurement in one system
- Tunnel measurement design for High
Semiconductor Advanced Packaging Optical Metrology System Model 7505 Series
The system uses white light interference measurement technique to perform nondestructive and rapid surface profile measurement and analysis, which is suitable for 12″ wafer.