Chroma 7212-HS is a linescan AOI inspector used to provide superior PV cells defect inspection. As the fine grid printing process goes even faster than before, a reliable printing quality inspector is inevitable to reduce the cost during the PV cells metallization. Chroma 7212-HS provides 14 μm/pixel resolution that could stops even the finest finger interruptions during the metallization process, and also feed back to the operator for instant response to improve the production yield rate.
We could also use Chroma 7212-HS with 20μm/pixel resolution to make the final quality judgment on the PV cell sorting process. Optical design in Chroma 7212-HS is even better, it provides superior inspection result for defects like stain and finger prints, which had been always a hurdle in other PV AOI products.
Anti-reflection Coating Inspector Model 7214-D
- Anti-reflection Coating Inspector
- Defects and color variance detection
- Install right after the PECVD or before the metallization process
Solar Cell Backside Printing and Surface Inspector Model 7213-AD
- Solar Cell Backside Printing & Surface Inspector (Diffuser type)
- V-cut and flake inspection
- Install on the metallization process and sorting process
Solar Safer Sawmark Inspector Model 7231
- Solar wafer sawmark inspector
- EN-50513 2009 compliance
- High reliability
Solar Wafer Quality Inspector Model 7202
- Solar wafer quality inspector
- Accurate grain-size calculation
- Pinhole and chipping inspection
Solar Wafer Geometry and Surface Inspector Model 7201
- Solar wafer geometry and surface inspector
- RGB LED strobe lighting
- High speed inspection
Printer Automatic Optical Inspector Model 7210-P
- Solar cell front-side printing defect inspector
- Detect the defects generated when fabricating PERC and Bifacial solar cells.
Solar Cell Quality Classifier Model 7210
- Install on the front-end screen printing process or terminal sorting equipment.
- Solar cell front or back side printing defect all can be detected.
Automatic Optical Solar Cell/Wafer Inspection System Model 7200 Series
Chroma 7200 series are specially designed for detecting wide variety of defects observed for c-Si cells & wafers for all sizes and crystallizations.