Defects causes by back-side printing process of c-Si PV cells will also cause performance, reliability impact. Among all the back-side printing defects, bumps caused by improper printing may cause high cell breakage rate during lamination of c-Si module process. Chroma 7213-AD c-Si cell back-side printing inspector uses unique lighting technique to detect common back-side printing defects plus most demanding bumps.
Another model Chroma 7213, with same inspection capability but was designed for special upward-detection. This brings unparallel advantage against conventional downward-detection design. With upward detection, the cell can be checked without being flipped twice which helps to minimize the cell breakage and reduce the production line length.
Same as Chroma 7212-HD, Chroma 7213-AD can be used after back-side process to retire cells with major defects. It can also be integrated to in-line or off-line sorter for final inspection prior to shipping.
Anti-reflection Coating Inspector Model 7214-D
- Anti-reflection Coating Inspector
- Defects and color variance detection
- Install right after the PECVD or before the metallization process
Solar Safer Sawmark Inspector Model 7231
- Solar wafer sawmark inspector
- EN-50513 2009 compliance
- High reliability
Solar Cell Frontside Printing and Surface Defect Inspector (High-Speed) Model 7212-HS
- Integrated with screen printing line and cell sorting lines from any manufacturers
- Flexible and intuitive SW user interface
Solar Wafer Quality Inspector Model 7202
- Solar wafer quality inspector
- Accurate grain-size calculation
- Pinhole and chipping inspection
Solar Wafer Geometry and Surface Inspector Model 7201
- Solar wafer geometry and surface inspector
- RGB LED strobe lighting
- High speed inspection
Printer Automatic Optical Inspector Model 7210-P
- Solar cell front-side printing defect inspector
- Detect the defects generated when fabricating PERC and Bifacial solar cells.
Solar Cell Quality Classifier Model 7210
- Install on the front-end screen printing process or terminal sorting equipment.
- Solar cell front or back side printing defect all can be detected.
Automatic Optical Solar Cell/Wafer Inspection System Model 7200 Series
Chroma 7200 series are specially designed for detecting wide variety of defects observed for c-Si cells & wafers for all sizes and crystallizations.