Automatic Optical Solar Cell/Wafer Inspection System Model 7200 Series

Key Features

  • Adjustable criteria for different process application or model
  • Flexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cells
  • Multiple interface to communicate with manufacturing equipment or information system
  • Various defects inspection capability from multilayer LED lighting design
  • Flexible design that can be easily integrated to your in-line printing system and sorting system


Among several fac tor s for PV to achieve grid-parity, reliability of the PV modules plays an important role. Since it’s known that some of the cell defects such as edge chips/ flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to detect those defects is very important for c-Si cell manufacturers.

However, most of cell defects are inherited by wafers. Therefore, both cell and wafer defect inspections are crucial to final PV module quality and reliability.

Due to the inc rea s ing BIPV and roof top application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers.

Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell & wafer lines.

Chroma 7200 series are specially designed for detecting wide variety of defects observed for c-Si cells & wafers for all sizes and crystallizations. Base on the process needs, eight inspectors are available for both incoming wafer and final cell sorting requirements.

Related Products

Cylindrical Battery Cell Automated Optical Inspection System Model 7505-K006

Applies to various cylindrical battery sizes on the mainstream market.

Thin Film Thickness Automated Optical Metrology System Model 7505-K007

Applies to Roll to Roll processing and thin film thickness inspection.

Inline Printing Quality Automated Optical Inspection System Model 7505-K009

Applies to Roll to Roll processing and on-line quality control

Anti-reflection Coating Inspector Model 7214-D

  • Anti-reflection Coating Inspector
  • Defects and color variance detection
  • Install right after the PECVD or before the metallization process

Solar Cell Backside Printing and Surface Inspector Model 7213-AD

  • Solar Cell Backside Printing & Surface Inspector (Diffuser type)
  • V-cut and flake inspection
  • Install on the metallization process and sorting process

Solar Safer Sawmark Inspector Model 7231

  • Solar wafer sawmark inspector
  • EN-50513 2009 compliance
  • High reliability

Solar Cell Frontside Printing and Surface Defect Inspector (High-Speed) Model 7212-HS

  • Integrated with screen printing line and cell sorting lines from any manufacturers
  • Flexible and intuitive SW user interface

Solar Wafer Quality Inspector Model 7202

  • Solar wafer quality inspector
  • Accurate grain-size calculation
  • Pinhole and chipping inspection