RF LCR METER MODEL 11090-030

Key Features

 

  • Measurement parameters: Z, θz, Y, θy, R, X, G, B, Ls, Lp, Cs, Cp, Rs, Rp, D, Q
  • Test frequencies: 100kHz~300MHz
  • Measurement range: 100mΩ~5kΩ
  • Measurement speed: 0.5/0.9/2.1/3.7 (ms)
  • Basic accuracy: ± 0.8% % (typical ± 0.45%)
  • Test signal: -40~1(dBm)
  • Measurement modes: Point/List
  • Test signal (Vm, lm) monitoring function
  • Comparator and sorting (13 bins) functions
  • Contact Check (Rdc 0.1Ω~100Ω @ 1mA max)
  • Open/short circuit correction and load compensation functions
  • Standard interfaces: Handler, RS-232C, GPIB, LAN, USB, USB (USBTMC)

Description

Chroma 11090-030 RF LCR Meter provides a high-frequency measurement and evaluation solution for passive components such as SMD chip inductors and RF filters. With a testing frequency of up to 300MHz, this instrument not only meets the increasing demand for nominal frequency testing of components like POL or small DC-DC converters, but also addresses quality anomalies that can only be detected at ultra-high frequencies. Additionally, it can fulfill common 100MHz impedance testing needs for components like EMI filters and ferrite beads.

This solution covers measurement parameters such as Z, θz, Y, θy, R, X, G, B, Ls, Lp, Cs, Cp, Rs, Rp, D, Q and other primary and secondary parameters required for testing various passive components. The wide test frequency range of 100kHz to 300MHz, using RF current-voltage conversion technology, provides a broader impedance measurement range than network analyzers and a higher frequency measurement range than auto-balancing bridge technology. This makes it suitable for analyzing passive component characteristics at different frequencies by R&D and quality assurance units. Furthermore, the instrument’s ultra-low noise, low harmonic distortion signal generator delivers a high-quality measurement signal, enhancing the accuracy of impedance testing.

The 11090-030 has a basic measurement accuracy of 0.8%, ensuring highly stable and reliable measurement results. The rapid 0.5ms measurement speed significantly increases production efficiency when employed in an automated environment. The SMD test fixture is compatible with various kinds of small sized SMDs and adopts an improved pushdown actuation method, which can rotate 90 degrees and requires only three steps to change the DUT (actual testing takes about 40 seconds). This accelerates the speed of test by reducing time spent on changing differently sized DUTs and eliminating the need for repeated reassembly of device guides, which also reduces wear and maintenance costs.

Through its comprehensive design and powerful functional enhancements, Chroma 11090-030 offers a complete test solution for product characterization, rapid testing in automated production lines, and various incoming and outgoing inspection applications

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