Capacitor Leakage Current/IR Meter (CLC/IR Meter) Model 11200

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Data Sheet

Key Features

  • Capacitor leakage current test function
  • Insulation resistance (IR) test function
  • Basic accuracy: 0.3%
  • Constant current DC power source with discharge function
  • Forward voltage function for diode, LED, zener diode and varistor
  • Surge voltage test function for electrolytic capacitor (JIS C5101/5102/5140/5141)
  • Option contact check function to improve test reliability
  • Aluminum-foil withstand voltage and risetime test function (for EIAJ RC-2364A)
  • Precision low constant current charge capability (0.5mA ±0.05mA, meet EIAJ RC-2364A requirement for withstand voltage testing of lower WV aluminum-foil)
  • Large charge current (500mA) capability to fasten charge speed
  • 1.0V~650V/800V DC voltage source
  • 0.001uA~20.00mA leakage current test range with 4 digits resolution
  • Digital timer inside
  • Comparator and pass/fail alarming beeper function
  • Standard RS-232 interface
  • Optional GPIB & handler interface

Applications

  • Various electrolytic capacitors, high dielectric ceramic capacitor, etc.
  • Aluminum-foil withstand voltage test (for EIAJ RC-2364A)
  • Semiconductor component leakage current test or insulation resistance test
  • Insulation resistance test of various anti-static electric materials or non-ultrahigh insulation materials (IR)

Description

The 11200 Capacitor Leakage Current / IR Meter is Chroma’s newest digital leakage cur rent meter. I t provides DC 1~650V, 0 . 5~5 0 0mA ( 1 5 0mA f o r V>1 0 0V) o r DC1~800V, 0.5~500mA (50mA for V>100V) DC power source wi th vol tage meter and nano-ampere meter. Mainly used for electrolytic capacitor leakage current testing, and aluminum-foil withstand voltage testing (EIAJ RC-2364A). And also can be used for active voltage checking or leakage current testing of absorber, zener diode, neon lamp, etc. Standard RS-232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11200 can be used for both component evaluat ion on the product ion l ine and fundamental leakage current or IR testing for bench-top applications.

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