Advanced SoC/Analog Test System Model 3650

Key Features

  • 50/100 MHz; 200 MHz (MUX) clock rate
  • 50/100 Mbps; 200 Mbps (MUX) data rate
  • Up to 640 digital I/O pins [testhead 2]
  • 16/32 (option) MW vector memory
  • 16/32 (option) MW pattern instruction memory
  • Per-pin timing/ PPMU/ frequency measurement
  • Scan features to 1G depth per scan chain
  • ALPG option for memory test
  • Up to 40 high-voltage pins
  • Up to 8-32 16-bit ADDA channels option
  • 32 high-performance DPS channels
  • Edge placement accuracy ±300ps
  • 32 CH HDADDA mixed-signal option
  • 8 CH AWG and digitizer ASO mixed-signal audio band test option
  • 40A pulse at 60V for MPVI analog option*
  • 8~32-CH/ board for VI45 analog option
  • 2~8-CH/ board for PVI100 analog option
  • MRX option for 3rd party PXI instruments
  • Microsoft windows® XP OS
  • C++ and GUI programming interface
  • CRISP, full suite of intuitive software tools
  • Test program and pattern converters for other platforms
  • Accept DIB and probe card of other testers directly
  • Support STDF data output
  • Air-cooled, small footprint tester-in-a-test-head design

*Call for availability


Semiconductor manufacturing is a fast moving industry; more and more devices are highly integrated with various functions. Capital equipment must be built to outlive several device generations and applications. With varieties of available options, such as AD/DA converter test, ALPG for memory test, high voltage PE, multiple scan chain test, VI45 & PVI100 MPVI, ASO analog test options and HDADDA mixed-signal test options, Chroma 3650 can provide a wide coverage for customer to test different kind of devices with flexible configurations.

Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test, high accuracy, powerful software tools and excellent reliability, 3650 has the versatile test capabilities for high-performance microcontroller, analog IC, consumer SoC devices, and wafer sort applications.

Related Products

Advanced SoC/Analog Test System Model 3680

  • 24 interchangeable slots for digital, analog and mixed-signal applications
  • 150 Mbps up to 1Gbps data rate (muxed)
  • Up to 512 sites parallel test
  • Up to 2048 digital I/O pins

Advanced SoC/Analog Test System Model 3650-EX

  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX