Advanced SoC/Analog Test System Model 3650

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Data Sheet

Key Features

50/100 MHz; 200 MHz (MUX) clock rate
50/100 Mbps; 200 Mbps (MUX) data rate
Up to 640 digital I/O pins [testhead 2]
16/32 (option) MW vector memory
16/32 (option) MW pattern instruction memory
Per-pin timing/ PPMU/ frequency measurement
Scan features to 1G depth per scan chain
ALPG option for memory test
Up to 40 high-voltage pins
Up to 8-32 16-bit ADDA channels option
32 high-performance DPS channels
Edge placement accuracy ±300ps
32 CH HDADDA mixed-signal option
8 CH AWG and digitizer ASO mixed-signal audio band test option
40A pulse at 60V for MPVI analog option*
8~32-CH/ board for VI45 analog option
2~8-CH/ board for PVI100 analog option
MRX option for 3rd party PXI instruments
Microsoft windows® XP OS
C++ and GUI programming interface
CRISP, full suite of intuitive software tools
Test program and pattern converters for other platforms
Accept DIB and probe card of other testers directly
Support STDF data output
Air-cooled, small footprint tester-in-a-test-head design

*Call for availability

Description

Semiconductor manufacturing is a fast moving industry; more and more devices are highly integrated with various functions. Capital equipment must be built to outlive several device generations and applications. With varieties of available options, such as AD/DA converter test, ALPG for memory test, high voltage PE, multiple scan chain test, VI45 & PVI100 MPVI, ASO analog test options and HDADDA mixed-signal test options, Chroma 3650 can provide a wide coverage for customer to test different kind of devices with flexible configurations.

Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test, high accuracy, powerful software tools and excellent reliability, 3650 has the versatile test capabilities for high-performance microcontroller, analog IC, consumer SoC devices, and wafer sort applications.

Related Products

Advanced SoC/Analog Test System Model 3680

24 interchangeable slots for digital, analog and mixed-signal applications
150 Mbps up to 1Gbps data rate (muxed)
Up to 512 sites parallel test
Up to 2048 digital I/O pins

High Density Audio Video Option HDAVO

Chroma 3680 optional module

Advanced SoC/Analog Test System Model 3650-EX

Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
Expandable platform with up to 1024 IO channels and 96 DPS
50/100 MHz, 200 MHz (MUX) Test Rate
Varieties of high density options include VI45, PVI100, HDADDA and MRX